23 June 2014

10:00-

Welcome by Prof. P. Urbach (Delft) followed by Michiel Coenen (Holst Centre, Eindhoven): Introduction to the Project Clean 4 Yield

11:00-

Lecture on OLED Technology, Soeren Hartmann, Philips Technologie, GmbH, Germany

12:30-

Lunch

14:00-

Introduction to solar cells and photovoltaics and electrical characterisation, M. Jorgensen (DTU) and Dieter Karg, (DCG Systems), Denmark

15:30-

Coffee break

16:00-

Discussions, introduction to the Optics Research Group, poster and short oral presentations, Room E008, Applied Physics Building, TU Delft, The Netherlands

24 June 2014

09:00-

Localization of electrical defects in solar cells and LEDs using Lock-in Thermography, M. Jorgensen (DTU) and Dieter Karg, (DCG Systems), Denmark

10:30-

Coffee break

11:00-

Contamination of surfaces, J. van den Donck, TNO, Delft, The Netherlands

12:30-

Lunch break

14:00-

Cleaning of substrates, Sheila Hamilton, Teknek, United Kingdom

15:30-

Break followed by visit tour to TNO Science and Industry, Delft

25 June 2014

09:00-

Automated optical inspection systems and their application for Clean4Yield and industry, Part 1: General overview of today's inspection systems and their possibilities, Thomas Laumeyer, Dr. Schenk, Germany

10:30-

Coffee break

11:00-

Automated optical inspection systems and their application for Clean4Yield and industry, Part 2: Inspection and detection related to the topics of Clean4Yield, Simone Dafinger, Dr. Schenk, Germany

12:30-

Lunch break

14:00-

Scatterometry for metrology and inspection of surfaces, Silvania Pereira, TU Delft, The Netherlands

15:30-

Social event: excursion to Delft city centre followed by dinner

26 June 2014

09:00-

Thin film characterization by Ellipsometry - Principles of the technique and application in Clean4Yield project, Michel Stchakovsky, Horiba, France

10:30-

Coffee break

11:00-

Luminiscent solar cell concentrators and materials, and nanoplasmonics in combination with LEDs, Dick de Boer, Philips Research, The Netherlands

12:45-

Lunch break

14:15-

Advanced areal metrology for defect detection on thin film substrates, Prof. Liam Blant, University of Huddersfield, United Kingdom

16:00-

Tour to the labs of optics research group, TU Delft.

27 June 2014

09:00-

Bus leaves Delft to Eindhoven

11:00-

Fundamentals and processing of organic light emitting diodes and organic photovoltaics, Ike de Vries, Holst Centre, The Netherlands

12:30-

Lunch followed by a lab tour

16:00-

Bus comes back to Delft